Features
- Find most manufacturing faults
- Easy to program and use
- Flexibility to support many testing applications
- Inexpensive
- Optional power-up testing
Applications
- Circuit assemblies
- Back planes
- Terminators
- Cable/Harness assemblies
Analyst ems 12KN Overview
Overview
The Analyst ems Low-Cost In-Circuit Test (ICT) System provides the
capability to quickly and easily test assemblies for common manufacturing
defects such as incorrect, missing or misoriented components, and
opens and shorts. These faults comprise the vast majority of problems
encountered in the typical manufacturing flow. ICT systems can quickly
and accurately measure continuity, capacitors, resistors, inductors,
voltages, semiconductor junction voltages, and SMT connections for
opens. With these basic tools, ICTs can find most faults in analog
or digital assemblies before board power-up.
The CheckSum Analyst ems is designed for testing all types of circuit
assemblies. The System combines manufacturing process testing with
TestJet Technology to test a single assembly or a panel of multiple
assemblies.
The Analyst ems tests the entire unit-under-test (UUT) and individual
components without power applied. Using sophisticated measurement
techniques such as DC or complex-impedance measurements in conjunction
with multi-point guarding, it provides the capability to find the
majority of faults such as shorts, opens and wrong or incorrectly
installed components. By finding the majority of faults while the
UUT is in the safe unpowered mode, and with very specific fault
diagnostic messages, faulty UUTs can be repaired quickly.
The Analyst ems is designed to be used for most common through-hole
and SMT circuit assemblies. It can perform effective power-down
testing for most analog or digital assemblies being manufactured
today. The optional power-up functional test capability is ideally
suited for lower frequency analog assemblies with some digital content.
Download
Analyst ems data sheet and specifications
Download
the Analyst ems manual
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